SILICON Libs EFR32BG22 Wireless Gecko SoC Family Data Sheet

Table of Contents

EFR32BG22 Wireless Gecko SoC Family Data Sheet

The EFR32BG22 Wireless Gecko family of SoCs is part of the Wireless Gecko portfolio. EFR32BG22 Wireless Gecko SoCs are ideal for enabling energy-friendly Bluetooth 5.2 networking for IoT devices.The single-die solution combines a 76.8 MHz Cortex-M33 with a high performance 2.4 GHz radio to provide an industry-leading, energy efficient wireless, SoC for IoT connected applications.

Wireless Gecko applications include

• Asset Tags and Beacons• Consumer Electronics Remote Controls• Portable Medical• Bluetooth Mesh Low Power Nodes• Sports, Fitness, and Wellness devices• Connected Home• Building Automation and Security

KEY FEATURES

• 32-bit ARM® Cortex®-M33 core with 76.8 MHz maximum operating frequency• Up to 512 kB of flash and 32 kB of RAM• Energy-efficient radio core with low active and sleep currents• Bluetooth 5.2 Direction Finding• Integrated PA with up to 6 dBm (2.4 GHz) TX power• Secure Boot with Root of Trust and Secure Loader (RTSL)

Feature List

The EFR32BG22 highlighted features are listed below.

Low Power Wireless System-on-Chip

High Performance 32-bit 76.8 MHz MHz ARM Cortex®-M33 with DSP instruction and floating-point unit for efficient sig- nal processing
Up to 512 kB flash program memory
Up to 32 kB RAM data memory
2.4 GHz radio operation

Radio Performance

-106.7 dBm sensitivity @ 125 kbps GFSK
-98.9 dBm sensitivity @ 1 Mbit/s GFSK
-96.2 dBm sensitivity @ 2 Mbit/s GFSK
TX power up to 6 dBm
2.5 mA radio receive current
3.4 mA radio transmit current @ 0 dBm output power
7.5 mA radio transmit current @ 6 dBm output power

Low System Energy Consumption

3.6 mA RX current (1 Mbps GFSK)
4.1 mA TX current @ 0 dBm output power
8.2 mA TX current @ 6 dBm output power
27 μA/MHz in Active Mode (EM0) at 76.8 MHz
1.40 μA EM2 DeepSleep current (32 kB RAM retention and RTC running from LFXO)
1.75 μA EM2 DeepSleep current (32 kB RAM retention and RTC running from Precision LFRCO)
0.17 μA EM4 current

Supported Modulation Format

2 (G)FSK with fully configurable shaping
OQPSK DSSS
(G)MSK

Protocol Support

Bluetooth Low Energy (Bluetooth 5.2)
Direction finding using Angle-of-Arrival (AoA) and Angle-of- Departure (AoD)
Proprietary

Wide selection of MCU peripherals

Analog to Digital Converter (ADC)
12-bit @ 1 Msps
16-bit @ 76.9 ksps
Up to 26 General Purpose I/O pins with output state reten- tion and asynchronous interrupts
8 Channel DMA Controller
12 Channel Peripheral Reflex System (PRS)
4 × 16-bit Timer/Counter with 3 Compare/Capture/PWM channels
1 × 32-bit Timer/Counter with 3 Compare/Capture/PWM channels
32-bit Real Time Counter
24-bit Low Energy Timer for waveform generation
1 × Watchdog Timer
2 × Universal Synchronous/Asynchronous Receiver/Trans- mitter (UART/SPI/SmartCard (ISO 7816)/IrDA/I2S)
1 × Enhanced Universal Asynchronous Receiver/Transmit- ter (EUART)
2 × I2C interface with SMBus support
Digital microphone interface (PDM)
Precision Low-Frequency RC Oscillator to replace 32 kHz sleep crystal
RFSENSE with selective OOK mode
Die temperature sensor with +/-1.5 degree C accuracy after single-point calibration

Wide Operating Range

1.71 V to 3.8 V single power supply
-40 °C to 125 °C

Security Features

Secure Boot with Root of Trust and Secure Loader (RTSL)
Hardware Cryptographic Acceleration for AES128/256, SHA-1, SHA-2 (up to 256-bit), ECC (up to 256-bit), ECDSA, and ECDH
True Random Number Generator (TRNG) compliant with NIST SP800-90 and AIS-31
ARM® TrustZone®
Secure Debug with lock/unlock

Packages

QFN40 5 mm × 5 mm × 0.85 mm
QFN32 4 mm × 4 mm × 0.85 mm
TQFN32 4 mm × 4 mm × 0.30 mm

Ordering Information

Ordering Code	Protocol Stack	Max TX Power	Max CPU Speed	LFRCO	Flash (kB)	RAM (kB)	GPIO	Package	Temp Range
EFR32BG22C222F352GM32-C	Bluetooth 5.2 Proprietary	6 dBm	76.8 MHz	Precision	352	32	18	QFN32	-40 to 85 °C
EFR32BG22C222F352GM40-C	Bluetooth 5.2 Proprietary	6 dBm	76.8 MHz	Precision	352	32	26	QFN40	-40 to 85 °C
EFR32BG22C222F352GN32-C	Bluetooth 5.2 Proprietary	6 dBm	76.8 MHz	Precision	352	32	18	TQFN32	-40 to 85 °C
EFR32BG22C224F512GM32-C	Bluetooth 5.2 Direction finding Proprietary	6 dBm	76.8 MHz	Precision	512	32	18	QFN32	-40 to 85 °C
EFR32BG22C224F512GM40-C	Bluetooth 5.2 Direction finding Proprietary	6 dBm	76.8 MHz	Precision	512	32	26	QFN40	-40 to 85 °C
EFR32BG22C224F512GN32-C	Bluetooth 5.2 Direction finding Proprietary	6 dBm	76.8 MHz	Precision	512	32	18	TQFN32	-40 to 85 °C
EFR32BG22C224F512IM32-C	Bluetooth 5.2 Direction finding Proprietary	6 dBm	76.8 MHz	Precision	512	32	18	QFN32	-40 to 125 °C
EFR32BG22C224F512IM40-C	Bluetooth 5.2 Direction finding Proprietary	6 dBm	76.8 MHz	Precision	512	32	26	QFN40	-40 to 125 °C

LE Long Range (125 kbps and 500 kbps) PHYs are only supported on part numbers which include AoA/AoD direction-finding capability.

System Overview

Introduction

The EFR32 product family combines an energy-friendly MCU with a high performance radio transceiver. The devices are well suited for secure connected IoT multi-protocol devices requiring high performance and low energy consumption. This section gives a short intro- duction to the full radio and MCU system. The detailed functional description can be found in the EFR32xG22 Reference Manual.

A block diagram of the EFR32BG22 family is shown in Figure 3.1 Detailed EFR32BG22 Block Diagram on page 7. The diagram shows a superset of features available on the family, which vary by OPN. For more information about specific device features, consult Ordering Information.

Radio

The EFR32BG22 Wireless Gecko features a highly configurable radio transceiver supporting the Bluetooth Low Energy wireless proto- col.

Antenna Interface

The 2.4 GHz antenna interface consists of a single-ended pin (RF2G4_IO). The external components for the antenna interface in typi- cal applications are shown in the RF Matching Networks section.

Fractional-N Frequency Synthesizer

The EFR32BG22 contains a high performance, low phase noise, fully integrated fractional-N frequency synthesizer. The synthesizer is used in receive mode to generate the LO frequency for the down-conversion mixer. It is also used in transmit mode to directly generate the modulated RF carrier.

The fractional-N architecture provides excellent phase noise performance, frequency resolution better than 100 Hz, and low energy consumption. The synthesizer’s fast frequency settling allows for very short receiver and transmitter wake up times to reduce system energy consumption.

Receiver Architecture

The EFR32BG22 uses a low-IF receiver architecture, consisting of a Low-Noise Amplifier (LNA) followed by an I/Q down-conversion mixer. The I/Q signals are further filtered and amplified before being sampled by the IF analog-to-digital converter (IFADC).

The IF frequency is configurable from 150 kHz to 1371 kHz. The IF can further be configured for high-side or low-side injection, providing flexibility with respect to known interferers at the image frequency.

The Automatic Gain Control (AGC) module adjusts the receiver gain to optimize performance and avoid saturation for excellent selectivity and blocking performance. The 2.4 GHz radio is calibrated at production to improve image rejection performance.

Demodulation is performed in the digital domain. The demodulator performs configurable decimation and channel filtering to allow receive bandwidths ranging from 0.1 to 2530 kHz. High carrier frequency and baud rate offsets are tolerated by active estimation and compensation. Advanced features supporting high quality communication under adverse conditions include forward error correction by block and convolutional coding as well as Direct Sequence Spread Spectrum (DSSS).

A Received Signal Strength Indicator (RSSI) is available for signal quality metrics, for level-based proximity detection, and for RF channel access by Collision Avoidance (CA) or Listen Before Talk (LBT) algorithms. An RSSI capture value is associated with each received frame and the dynamic RSSI measurement can be monitored throughout reception.

Transmitter Architecture

The EFR32BG22 uses a direct-conversion transmitter architecture. For constant envelope modulation formats, the modulator controls phase and frequency modulation in the frequency synthesizer. Transmit symbols or chips are optionally shaped by a digital shaping filter. The shaping filter is fully configurable, including the BT product, and can be used to implement Gaussian or Raised Cosine shap- ing.

Carrier Sense Multiple Access – Collision Avoidance (CSMA-CA) or Listen Before Talk (LBT) algorithms can be automatically timed by the EFR32BG22. These algorithms are typically defined by regulatory standards to improve inter-operability in a given bandwidth be- tween devices that otherwise lack synchronized RF channel access.

Packet and State Trace

The EFR32BG22 Frame Controller has a packet and state trace unit that provides valuable information during the development phase. It features:

Non-intrusive trace of transmit data, receive data and state information
Data observability on a single-pin UART data output, or on a two-pin SPI data output
Configurable data output bitrate /baudrate
Multiplexed transmitted data, received data and state / meta information in a single serial data stream

Data Buffering

The EFR32BG22 features an advanced Radio Buffer Controller (BUFC) capable of handling up to 4 buffers of adjustable size from 64 bytes to 4096 bytes. Each buffer can be used for RX, TX or both. The buffer data is located in RAM, enabling zero-copy operations.

Radio Controller (RAC)

The Radio Controller controls the top level state of the radio subsystem in the EFR32BG22. It performs the following tasks:

Precisely-timed control of enabling and disabling of the receiver and transmitter circuitry
Run-time calibration of receiver, transmitter and frequency synthesizer
Detailed frame transmission timing, including optional LBT or CSMA-CA

RFSENSE Interface

The RFSENSE block allows the device to remain in EM2, EM3 or EM4 and wake when RF energy above a specified threshold is detec- ted. When operated in selective mode, the RFSENSE block performs OOK preamble and sync word detection, preventing false wake- up events.

General Purpose Input/Output (GPIO)

EFR32BG22 has up to 26 General Purpose Input/Output pins. Each GPIO pin can be individually configured as either an output or input. More advanced configurations including open-drain, open-source, and glitch-filtering can be configured for each individual GPIO pin. The GPIO pins can be overridden by peripheral connections, like SPI communication. Each peripheral connection can be routed to several GPIO pins on the device. The input value of a GPIO pin can be routed through the Peripheral Reflex System to other peripher- als. The GPIO subsystem supports asynchronous external pin interrupts.

All of the pins on ports A and port B are EM2 capable. These pins may be used by Low-Energy peripherals in EM2/3 and may also be used as EM2/3 pin wake-ups. Pins on ports C and D are latched/retained in their current state when entering EM2 until EM2 exit upon which internal peripherals could once again drive those pads.

A few GPIOs also have EM4 wake functionality. These pins are listed in the Alternate Function Table.

Clocking

Clock Management Unit (CMU)

The Clock Management Unit controls oscillators and clocks in the EFR32BG22. Individual enabling and disabling of clocks to all periph- eral modules is performed by the CMU. The CMU also controls enabling and configuration of the oscillators. A high degree of flexibility allows software to optimize energy consumption in any specific application by minimizing power dissipation in unused peripherals and oscillators.

Internal and External Oscillators

The EFR32BG22 supports two crystal oscillators and fully integrates four RC oscillators, listed below.

A high frequency crystal oscillator (HFXO) with integrated load capacitors, tunable in small steps, provides a precise timing refer- ence for the MCU. The HFXO provides excellent RF clocking performance using a 38.4 MHz crystal. The HFXO can also support an external clock source such as a TCXO for applications that require an extremely accurate clock frequency over temperature.
A 32.768 kHz crystal oscillator (LFXO) provides an accurate timing reference for low energy modes.
An integrated high frequency RC oscillator (HFRCO) is available for the MCU system, when crystal accuracy is not required. The HFRCO employs fast start-up at minimal energy consumption combined with a wide frequency range, from 1 MHz to 76.8 MHz.
An integrated fast start-up RC oscillator (FSRCO) that runs at a fixed 20 MHz
An integrated low frequency 32.768 kHz RC oscillator (LFRCO) for low power operation without an external crystal. Precision mode enables periodic recalibration against the 38.4 MHz HFXO crystal to improve accuracy to +/- 500 ppm, suitable for BLE sleep inter- val timing.
An integrated ultra-low frequency 1 kHz RC oscillator (ULFRCO) is available to provide a timing reference at the lowest energy con- sumption in low energy modes.

Counters/Timers and PWM

Timer/Counter (TIMER)

TIMER peripherals keep track of timing, count events, generate PWM outputs and trigger timed actions in other peripherals through the Peripheral Reflex System (PRS). The core of each TIMER is a 16-bit or 32-bit counter with up to 3 compare/capture channels. Each channel is configurable in one of three modes. In capture mode, the counter state is stored in a buffer at a selected input event. In compare mode, the channel output reflects the comparison of the counter to a programmed threshold value. In PWM mode, the TIMER supports generation of pulse-width modulation (PWM) outputs of arbitrary waveforms defined by the sequence of values written to the compare registers. In addition some timers offer dead-time insertion. See 3.13 Configuration Summary for information on the feature set of each timer.

Low Energy Timer (LETIMER)

The unique LETIMER is a 24-bit timer that is available in energy mode EM0 Active, EM1 Sleep, EM2 Deep Sleep, and EM3 Stop. This allows it to be used for timing and output generation when most of the device is powered down, allowing simple tasks to be performed while the power consumption of the system is kept at an absolute minimum. The LETIMER can be used to output a variety of wave- forms with minimal software intervention. The LETIMER is connected to the Peripheral Reflex System (PRS), and can be configured to start counting on compare matches from other peripherals such as the RTCC.

Real Time Clock with Capture (RTCC)

The Real Time Clock with Capture (RTCC) is a 32-bit counter providing timekeeping down to EM3. The RTCC can be clocked by any of the on-board low-frequency oscillators, and it is capable of providing system wake-up at user defined intervals.

A secondary RTC is used by the RF protocol stack for event scheduling, leaving the primary RTCC block available exclusively for appli- cation software.

Back-Up Real Time Counter

The Back-Up Real Time Counter (BURTC) is a 32-bit counter providing timekeeping in all energy modes, including EM4. The BURTC can be clocked by any of the on-board low-frequency oscillators, and it is capable of providing system wake-up at user defined invervals.

Watchdog Timer (WDOG)

The watchdog timer can act both as an independent watchdog or as a watchdog synchronous with the CPU clock. It has windowed monitoring capabilities, and can generate a reset or different interrupts depending on the failure mode of the system. The watchdog can also monitor autonomous systems driven by the Peripheral Reflex System (PRS).

Communications and Other Digital Peripherals

Universal Synchronous/Asynchronous Receiver/Transmitter (USART)

The Universal Synchronous/Asynchronous Receiver/Transmitter is a flexible serial I/O module. It supports full duplex asynchronous UART communication with hardware flow control as well as RS-485, SPI, MicroWire and 3-wire. It can also interface with devices sup- porting:

ISO7816 SmartCards
IrDA
I2S

Enhanced Universal Asynchronous Receiver/Transmitter (EUART)

The Enhanced Universal Asynchronous Receiver/Transmitter supports full duplex asynchronous UART communication with hardware flow control, RS-485 and IrDA support. In EM0 and EM1 the EUART provides a high-speed, buffered communication interface. When routed to GPIO ports A or B, the EUART may also be used in a low-energy mode and operate in EM2. A 32.768 kHz clock source allows full duplex UART communication up to 9600 baud.

Inter-Integrated Circuit Interface (I2C)

The I2C module provides an interface between the MCU and a serial I2C bus. It is capable of acting as both a master and a slave and supports multi-master buses. Standard-mode, fast-mode and fast-mode plus speeds are supported, allowing transmission rates from 10 kbit/s up to 1 Mbit/s. Slave arbitration and timeouts are also available, allowing implementation of an SMBus-compliant system. The interface provided to software by the I2C module allows precise timing control of the transmission process and highly automated trans- fers. Automatic recognition of slave addresses is provided in active and low energy modes. Note that not all instances of I2C are avalia- ble in all energy modes.

Peripheral Reflex System (PRS)

The Peripheral Reflex System provides a communication network between different peripheral modules without software involvement. Peripheral modules producing Reflex signals are called producers. The PRS routes Reflex signals from producers to consumer periph- erals which in turn perform actions in response. Edge triggers and other functionality such as simple logic operations (AND, OR, NOT) can be applied by the PRS to the signals. The PRS allows peripherals to act autonomously without waking the MCU core, saving power.

Pulse Density Modulation (PDM) Interface

The PDM module provides a serial interface and decimation filter for Pulse Density Modulation (PDM) microphones, isolated Sigma- delta ADCs, digital sensors and other PDM or sigma delta bit stream peripherals. A programmable Cascaded Integrator Comb (CIC) filter is used to decimate the incoming bit streams. PDM supports stereo or mono input data and DMA transfer.

Security Features

The following security features are available on the EFR32BG22:

Secure Boot with Root of Trust and Secure Loader (RTSL)
Cryptographic Accelerator
True Random Number Generator (TRNG)
Secure Debug with Lock/Unlock

Secure Boot with Root of Trust and Secure Loader (RTSL)

The Secure Boot with RTSL authenticates a chain of trusted firmware that begins from an immutable memory (ROM).

It prevents malware injection, prevents rollback, ensures that only authentic firmware is executed and protects Over The Air updates. More information on this feature can be found in the Application Note AN1218: Series 2 Secure Boot with RTSL.

Cryptographic Accelerator

The Cryptographic Accelerator is an autonomous hardware accelerator which supports AES encryption and decryption with 128/192/256-bit keys, Elliptic Curve Cryptography (ECC) to support public key operations and hashes. Supported block cipher modes of operation for AES include:

ECB (Electronic Code Book)
CTR (Counter Mode)
CBC (Cipher Block Chaining)
CFB (Cipher Feedback)
GCM (Galois Counter Mode)
CBC-MAC (Cipher Block Chaining Message Authentication Code)
GMAC (Galois Message Authentication Code)
CCM (Counter with CBC-MAC)

The Cryptographic Accelerator accelerates Elliptical Curve Cryptography and supports the NIST (National Institute of Standards and Technology) recommended curves including P-192 and P-256 for ECDH(Elliptic Curve Diffie-Hellman) key derivation and ECDSA (El- liptic Curve Digital Signature Algorithm) sign and verify operations.

Supported hashes include SHA-1, SHA2/224, and SHA-2/256.

This implementation provides a fast and energy efficient solution to state of the art cryptographic needs.

True Random Number Generator

The True Random Number Generator module is a non-deterministic random number generator that harvests entropy from a thermal energy source. It includes start-up health tests for the entropy source as required by NIST SP800-90B and AIS-31 as well as online health tests required for NIST SP800-90C.

The TRNG is suitable for periodically generating entropy to seed an approved pseudo random number generator.

Secure Debug with Lock/Unlock

For obvious security reasons, it is critical for a product to have its debug interface locked before being released in the field.

In addition, the EFR32BG22 also provides a secure debug unlock function that allows authenticated access based on public key cryp- tography. This functionality is particularly useful for supporting failure analysis while maintaining confidentiality of IP and sensitive end- user data.

More information on this feature can be found in the Application Note AN1190: EFR32xG2x Secure Debug.

Analog

Analog to Digital Converter (IADC)

The IADC is a hybrid architecture combining techniques from both SAR and Delta-Sigma style converters. It has a resolution of 12 bits at 1 Msps and 16 bits at up to 76.9 ksps. Hardware oversampling reduces system-level noise over multiple front-end samples. The IADC includes integrated voltage reference options. Inputs are selectable from a wide range of sources, including pins configurable as either single-ended or differential.

Power

The EFR32BG22 has an Energy Management Unit (EMU) and efficient integrated regulators to generate internal supply voltages. Only a single external supply voltage is required, from which all internal voltages are created. An optional integrated DC-DC buck regulator can be utilized to further reduce the current consumption. The DC-DC regulator requires one external inductor and one external capaci- tor.

The EFR32BG22 device family includes support for internal supply voltage scaling, as well as two different power domains groups for peripherals. These enhancements allow for further supply current reductions and lower overall power consumption.

Energy Management Unit (EMU)

The Energy Management Unit manages transitions of energy modes in the device. Each energy mode defines which peripherals and features are available and the amount of current the device consumes. The EMU can also be used to implement system-wide voltage scaling and turn off the power to unused RAM blocks to optimize the energy consumption in the target application. The DC-DC regula- tor operation is tightly integrated with the EMU.

Voltage Scaling

The EFR32BG22 supports supply voltage scaling for the LDO powering DECOUPLE, with independent selections for EM0 / EM1 and EM2 / EM3. Voltage scaling helps to optimize the energy efficiency of the system by operating at lower voltages when possible. The default EM0 / EM1 voltage scaling level is VSCALE2, which allows the core to operate in active mode at full speed. The intermediate level, VSCALE1, allows operation in EM0 and EM1 at up to 40 MHz. The lowest level, VSCALE0, can be used to conserve power in EM2 and EM3. The EMU will automatically switch the target voltage scaling level when transitioning between energy modes.

DC-DC Converter

The DC-DC buck converter covers a wide range of load currents, provides high efficiency in energy modes EM0, EM1, EM2 and EM3, and can supply up to 60 mA for device and radio operation. RF noise mitigation allows operation of the DC-DC converter without significantly degrading sensitivity of radio components. An on-chip supply-monitor signals when the supply voltage is low to allow bypass of the regulator via programmable software interrupt. It employs soft switching at boot and DCDC regulating-to-bypass transitions to limit the max supply slew-rate and mitigate inrush current.

Power Domains

The EFR32BG22 has three peripheral power domains for operation in EM2 and EM3, as well as the ability to selectively retain configu- rations for EM0/EM1 peripherals. A small set of peripherals always remain powered on in EM2 and EM3, including all peripherals which are available in EM4. If all of the peripherals in PD0B or PD0C are configured as unused, that power domain will be powered off in EM2 or EM3, reducing the overall current consumption of the device. Likewise, if the application can tolerate the setup time to re-configure used EM0/EM1 peripherals on wake, register retention for these peripherals can be disabled to further reduce the EM2 or EM3 current.

Peripheral Power Subdomains

Always available in EM2/EM3	Power Domain PD0B	Power Domain PD0C
RTCC	LETIMER0	LFRCO (Precision Mode)
LFRCO (Non-precision mode)1	IADC0
LFXO1	I2C0
BURTC1	WDOG0
RFSENSE1	EUART0
ULFRCO1	PRS
FSRCO	DEBUG
Note: 1. Peripheral also available in EM4.

Reset Management Unit (RMU)

The RMU is responsible for handling reset of the EFR32BG22. A wide range of reset sources are available, including several power supply monitors, pin reset, software controlled reset, core lockup reset, and watchdog reset.

Core and Memory

Processor Core

The ARM Cortex-M processor includes a 32-bit RISC processor integrating the following features and tasks in the system:

ARM Cortex-M33 RISC processor achieving 1.50 Dhrystone MIPS/MHz
ARM TrustZone security technology
Embedded Trace Macrocell (ETM) for real-time trace and debug
Up to 512 kB flash program memory
Up to 32 kB RAM data memory
Configuration and event handling of all modules
2-pin Serial-Wire debug interface

Memory System Controller (MSC)

The Memory System Controller (MSC) is the program memory unit of the microcontroller. The flash memory is readable and writable from both the Cortex-M and DMA. In addition to the main flash array where Program code is normally written the MSC also provides an Information block where additional information such as special user information or flash-lock bits are stored. There is also a read-only page in the information block containing system and device calibration data. Read and write operations are supported in energy modes EM0 Active and EM1 Sleep.

Linked Direct Memory Access Controller (LDMA)

The Linked Direct Memory Access (LDMA) controller allows the system to perform memory operations independently of software. This reduces both energy consumption and software workload. The LDMA allows operations to be linked together and staged, enabling sophisticated operations to be implemented.

Memory Map

The EFR32BG22 memory map is shown in the figures below. RAM and flash sizes are for the largest memory configuration.

Configuration Summary

The features of the EFR32BG22 are a subset of the feature set described in the device reference manual. The table below describes device specific implementation of the features. Remaining modules support full configuration.

Configuration Summary

Module	Lowest Energy Mode	Configuration
I2C0	EM21
I2C1	EM1
IADC0	EM2
LETIMER0	EM21
PDM	EM1	2-channel
TIMER0	EM1	32-bit, 3-channels, +DTI
TIMER1	EM1	16-bit, 3-channels, +DTI
TIMER2	EM1	16-bit, 3-channels, +DTI
TIMER3	EM1	16-bit, 3-channels, +DTI
TIMER4	EM1	16-bit, 3-channels, +DTI
EUART0	EM1 – Full high-speed operation EM21 – Low-energy operation, 9600 Baud
USART0	EM1	+IrDA, +I2S, +SmartCard
USART1	EM1	+IrDA, +I2S, +SmartCard
Note: 1. EM2 and EM3 operation is only supported for digital peripheral I/O on Port A and Port B. All GPIO ports support digital peripheral operation in EM0 and EM1.

Electrical Specifications

Electrical Characteristics

All electrical parameters in all tables are specified under the following conditions, unless stated otherwise:

Typical values are based on TA=25 °C and all supplies at 3.0 V, by production test and/or technology characterization.
Radio performance numbers are measured in conducted mode, based on Silicon Laboratories reference designs using output pow- er-specific external RF impedance-matching networks for interfacing to a 50 Ω antenna.
Minimum and maximum values represent the worst conditions across supply voltage, process variation, and operating temperature, unless stated otherwise.

Power Supply Pin Dependencies

Due to on-chip circuitry (e.g., diodes), some EFR32 power supply pins have a dependent relationship with one or more other power supply pins. These internal relationships between the external voltages applied to the various EFR32 supply pins are defined below. Exceeding the below constraints can result in damage to the device and/or increased current draw.

VREGVDD & DVDD
In systems using the DCDC converter, DVDD (the buck converter output) should be connected to the recommended LDCDC and CDCDC, and should not be driven by an off-chip regulator.
In systems not using the DCDC converter, DVDD must be shorted to VREGVDD on the PCB (VREGVDD=DVDD)
DVDD ≥ DECOUPLE
PAVDD ≥ RFVDD
AVDD, IOVDD: No dependency with each other or any other supply pin

Absolute Maximum Ratings

Stresses beyond those listed below may cause permanent damage to the device. This is a stress rating only and functional operation of the devices at those or any other conditions beyond those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. For more information on the available quality and relia- bility data, see the Quality and Reliability Monitor Report at http://www.silabs.com/support/quality/pages/default.aspx.

Absolute Maximum Ratings

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Storage temperature range	TSTG		-50	—	+150	°C
Voltage on any supply pin1	VDDMAX		-0.3	—	3.8	V
Junction temperature	TJMAX	-G grade	—	—	+105	°C
-I grade	—	—	+125	°C
Voltage ramp rate on any supply pin	VDDRAMPMAX		—	—	1.0	V / µs
Voltage on HFXO pins	VHFXOPIN		-0.3	—	1.4	V
DC voltage on any GPIO pin	VDIGPIN		-0.3	—	VIOVDD + 0.3	V
DC voltage on RESETn pin2	VRESETn		-0.3	—	3.8	V
Input RF level on RF pins RF2G4_IO	PRFMAX2G4		—	—	+10	dBm
Absolute voltage on RF pin RF2G4_IO	VMAX2G4		-0.3	—	VPAVDD + 0.3	V
Total current into VDD power lines	IVDDMAX	Source	—	—	200	mA
Total current into VSS ground lines	IVSSMAX	Sink	—	—	200	mA
Current per I/O pin	IIOMAX	Sink	—	—	50	mA
Source	—	—	50	mA
Current for all I/O pins	IIOALLMAX	Sink	—	—	200	mA
Source	—	—	200	mA
Note: The maximum supply voltage on VREGVDD is limited under certain conditions when using the DC-DC. See the DC-DC specifica- tions for more details. The RESETn pin has a pull-up device to the DVDD supply. For minimum leakage, RESETn should not exceed the voltage at DVDD.

General Operating Conditions

Table 4.2. General Operating Conditions

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Operating ambient tempera- ture range	TA	-G temperature grade 1	-40	—	+85	°C
-I temperature grade 1	-40	—	+125	° C
DVDD supply voltage	VDVDD	EM0/1	1.71	3.0	3.8	V
EM2/3/42	1.71	3.0	3.8	V
AVDD supply voltage	VAVDD		1.71	3.0	3.8	V
IOVDDx operating supply voltage (All IOVDD pins)	VIOVDDx		1.71	3.0	3.8	V
PAVDD operating supply voltage	VPAVDD		1.71	3.0	3.8	V
VREGVDD operating supply voltage	VVREGVDD	DC-DC in regulation3	2.2	3.0	3.8	V
DC-DC in bypass 60 mA load	1.8	3.0	3.8	V
DC-DC not in use. DVDD exter- nally shorted to VREGVDD	1.71	3.0	3.8	V
RFVDD operating supply voltage	VRFVDD		1.71	3.0	VPAVDD	V
DECOUPLE output capaci- tor4	CDECOUPLE	1.0 µF ± 10% X8L capacitor used for performance characterization.	1.0	—	2.75	µF
HCLK and SYSCLK frequen- cy	fHCLK	VSCALE2, MODE = WS1	—	—	76.8	MHz
VSCALE2, MODE = WS0	—	—	40	MHz
VSCALE1, MODE = WS0	—	—	40	MHz
PCLK frequency	fPCLK	VSCALE2	—	—	50	MHz
VSCALE1	—	—	40	MHz
EM01 Group A clock fre- quency	fEM01GRPACLK	VSCALE2	—	—	76.8	MHz
VSCALE1	—	—	40	MHz
EM01 Group B clock fre- quency	fEM01GRPBCLK	VSCALE2	—	—	76.8	MHz
VSCALE1	—	—	40	MHz
Radio HCLK frequency5	fRHCLK	VSCALE2 or VSCALE1	—	38.4	—	MHz

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Note:

The device may operate continuously at the maximum allowable ambient TA rating as long as the absolute maximum TJMAX is not exceeded. For an application with significant power dissipation, the allowable TA may be lower than the maximum TA rating. TA = TJMAX – (THETAJA x PowerDissipation). Refer to the Absolute Maximum Ratings table and the Thermal Characteristics table for TJMAX and THETAJA.
The DVDD supply is monitored by the DVDD BOD in EM0/1 and the LE DVDD BOD in EM2/3/4.
The maximum supply voltage on VREGVDD is limited under certain conditions when using the DC-DC. See the DC-DC specifica- tions for more details.
Murata GCM21BL81C105KA58L used for performance characterization. Actual capacitor values can be significantly de-rated from their specified nominal value by the rated tolerance, as well as the application’s AC voltage, DC bias, and temperature. The minimum capacitance counting all error sources should be no less than 0.6 µF.
The recommended radio crystal frequency is 38.4 MHz. Any crystal frequency other than 38.4 MHz is expressly not supported. See HFXO specifications for more detail on crystal tolerance.

DC-DC Converter

Test conditions: LDCDC = 2.2 µH (Samsung CIG22H2R2MNE), CDCDC = 4.7 µF (Samsung CL10B475KQ8NQNC), VVREGVDD = 3.0 V,VOUT = 1.8 V, IPKVAL in EM0/1 modes is set to 150 mA, and in EM2/3 modes is set to 90 mA, unless otherwise indicated.

Table 4.3. DC-DC Converter

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Input voltage range at VREGVDD pin1	VVREGVDD	DCDC in regulation, ILOAD = 60 mA, EM0/EM1 mode	2.2	3.0	3.8*	V
DCDC in regulation, ILOAD = 5 mA, EM0/EM1 or EM2/EM3 mode	1.8	3.0	3.8*	V
Bypass mode	1.8	3.0	3.8	V
Regulated output voltage	VOUT		—	1.8	—	V
Regulation DC accuracy	ACCDC	VVREGVDD ≥ 2.2 V, Steady state in EM0/EM1 mode or EM2/EM3 mode	-2.5	—	3.3	%
Regulation total accuracy	ACCTOT	With mode transitions between EM0/EM1 and EM2/EM3 modes	-5	—	7	%
Steady-state output ripple	VR	ILOAD = 20 mA in EM0/EM1 mode	—	14.3	—	mVpp
DC line regulation	VREG	ILOAD = 60 mA in EM0/EM1 mode, VVREGVDD ≥ 2.2 V	—	5.5	—	mV/V
DC load regulation	IREG	Load current between 100 µA and 60 mA in EM0/EM1 mode	—	0.27	—	mV/mA
Efficiency	EFF	Load current between 100 µA and 60 mA in EM0/EM1 mode, or be- tween 10 µA and 5 mA in EM2/EM3 mode	—	91	—	%
Output load current	ILOAD	EM0/EM1 mode, DCDC in regulation	—	—	60	mA
EM2/EM3 mode, DCDC in regulation	—	—	5	mA
Bypass mode	—	—	60	mA
Nominal output capacitor	CDCDC	4.7 µF ± 10% X7R capacitor used for performance characterization2	4.7	—	10	µF
Nominal inductor	LDCDC	± 20% tolerance	—	2.2	—	µH
Nominal input capacitor	CIN		CDCDC	—	—	µF
Resistance in bypass mode	RBYP	Bypass switch from VREGVDD to DVDD, VVREGVDD = 1.8 V	—	1.75	3	Ω
Powertrain PFET switch from VREGVDD to VREGSW, VVREGVDD = 1.8 V	—	0.86	1.5	Ω
Supply monitor threshold programming range	VCMP_RNG	Programmable in 0.1 V steps	2.0	—	2.3	V
Supply monitor threshold ac- curacy	VCMP_ACC	Supply falling edge trip point	-5	—	5	%

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Supply monitor threshold hysteresis	VCMP_HYST	Positive hysteresis on the supply rising edge referred to the falling edge trip point	—	4	—	%
Supply monitor response time	tCMP_DELAY	Supply falling edge at -100 mV / µs	—	0.6	—	µs
Note: The supported maximum VVREGVDD in regulation mode is a function of temperature and 10-year lifetime average load current. See more details in 4.4.1 DC-DC Operating Limits. Samsung CL10B475KQ8NQNC used for performance characterization. Actual capacitor values can be significantly de-rated from their specified nominal value by the rated tolerance, as well as the application’s AC voltage, DC bias, and temperature. The mini- mum capacitance counting all error sources should be no less than 2.4 µF.

DC-DC Operating Limits

The maximum supported voltage on the VREGVDD supply pin is limited under certain conditions. Maximum input voltage is a function of temperature and the average load current over a 10-year lifetime. Figure 4.1 Lifetime average load current limit vs. Maximum input voltage on page 23 shows the safe operating region under specific conditions. Exceeding this safe operating range may impact the reliability and performance of the DC-DC converter.

The average load current for an application can typically be determined by examining the current profile during the time the device is powered. For example, an application that is continuously powered which spends 99% of the time asleep consuming 2 µA and 1% of the time active and consuming 10 mA has an average lifetime load current of about 102 µA.

Figure 4.1. Lifetime average load current limit vs. Maximum input voltageThe minimum input voltage for the DC-DC in EM0/EM1 mode is a function of the maximum load current, and the peak current setting. Figure 4.2 Transient maximum load current vs. Minimum input voltage on page 23 shows the max load current vs. input voltage for different DC-DC peak inductor current settings.

Thermal Characteristics

Table 4.4. Thermal Characteristics

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Thermal Resistance Junction to Ambient QFN32 (4x4mm) Package	THE- TAJA_QFN32_4X4	4-Layer PCB, Natural Convection1	—	35.4	—	°C/W
Thermal Resistance Junction to Ambient TQFN32 (4x4mm) Package	THE- TAJA_TQFN32_4X 4	4-Layer PCB, Natural Convection1	—	40.2	—	°C/W
Thermal Resistance, Junc- tion to Ambient, QFN40 (5x5mm) Package	THE- TAJA_QFN40_5X5	4-Layer PCB, Natural Convection1	—	32.6	—	°C/W
Note: 1. Measured according to JEDEC standard JESD51-2A. Integrated Circuit Thermal Test Method Environmental Conditions – Natural Convection (Still Air).

Current Consumption

MCU current consumption using DC-DC at 3.0 V input

Unless otherwise indicated, typical conditions are: VREGVDD = 3.0 V. AVDD = DVDD = IOVDD = RFVDD = PAVDD = 1.8 V from DC- DC. Voltage scaling level = VSCALE1. TA = 25 °C. Minimum and maximum values in this table represent the worst conditions across process variation at TA = 25 °C.

Table 4.5. MCU current consumption using DC-DC at 3.0 V input

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Current consumption in EM0 mode with all peripherals dis- abled	IACTIVE	76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running Prime from flash, VSCALE2	—	28	—	µA/MHz
76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running while loop from flash, VSCALE2	—	27	—	µA/MHz
76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running CoreMark loop from flash, VSCALE2	—	37	—	µA/MHz
38.4 MHz crystal, CPU running Prime from flash	—	28	—	µA/MHz
38.4 MHz crystal, CPU running while loop from flash	—	26	—	µA/MHz
38.4 MHz crystal, CPU running CoreMark loop from flash	—	38	—	µA/MHz
38 MHz HFRCO, CPU running while loop from flash	—	22	—	µA/MHz
26 MHz HFRCO, CPU running while loop from flash	—	24	—	µA/MHz
16 MHz HFRCO, CPU running while loop from flash	—	27	—	µA/MHz
1 MHz HFRCO, CPU running while loop from flash	—	159	—	µA/MHz
Current consumption in EM1 mode with all peripherals dis- abled	IEM1	76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, VSCALE2	—	17	—	µA/MHz
38.4 MHz crystal	—	17	—	µA/MHz
38 MHz HFRCO	—	13	—	µA/MHz
26 MHz HFRCO	—	15	—	µA/MHz
16 MHz HFRCO	—	18	—	µA/MHz
1 MHz HFRCO	—	150	—	µA/MHz

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Current consumption in EM2 mode, VSCALE0	IEM2_VS	Full RAM retention and RTC run- ning from LFXO	—	1.40	—	µA
Full RAM retention and RTC run- ning from LFRCO	—	1.40	—	µA
Full RAM retention and RTC run- ning from LFRCO in precision mode	—	1.75	—	µA
24 kB RAM retention and RTC running from LFXO	—	1.32	—	µA
24 kB RAM retention and RTC running from LFRCO in precision mode	—	1.66	—	µA
8 kB RAM retention and RTC run- ning from LFXO	—	1.21	—	µA
8 kB RAM retention and RTC run- ning from LFRCO	—	1.20	—	µA
8 kB RAM retention and RTC run- ning from LFXO, Radio RAM and CPU cache not retained	—	1.03	—	µA
Current consumption in EM3 mode, VSCALE0	IEM3_VS	8 kB RAM retention and RTC run- ning from ULFRCO	—	1.05	—	µA
Additional current in EM2 or EM3 when any peripheral in PD0B is enabled1	IPD0B_VS		—	0.37	—	µA
Note: 1. Extra current consumed by power domain. Does not include current associated with the enabled peripherals. See for a list of the peripherals in each power domain.

MCU current consumption at 3.0 V

Unless otherwise indicated, typical conditions are: AVDD = DVDD = RFVDD = PAVDD = VREGVDD = 3.0 V. DC-DC not used. Voltage scaling level = VSCALE1. TA = 25 °C. Minimum and maximum values in this table represent the worst conditions across process variation at TA = 25 °C.

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Current consumption in EM0 mode with all peripherals dis- abled	IACTIVE	76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running Prime from flash, VSCALE2	—	42	—	µA/MHz
76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running while loop from flash, VSCALE2	—	39	—	µA/MHz
76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running CoreMark loop from flash, VSCALE2	—	54	—	µA/MHz
38.4 MHz crystal, CPU running Prime from flash	—	40	—	µA/MHz
38.4 MHz crystal, CPU running while loop from flash	—	39	—	µA/MHz
38.4 MHz crystal, CPU running CoreMark loop from flash	—	55	—	µA/MHz
38 MHz HFRCO, CPU running while loop from flash	—	33	50	µA/MHz
26 MHz HFRCO, CPU running while loop from flash	—	35	—	µA/MHz
16 MHz HFRCO, CPU running while loop from flash	—	40	—	µA/MHz
1 MHz HFRCO, CPU running while loop from flash	—	228	830	µA/MHz
Current consumption in EM1 mode with all peripherals dis- abled	IEM1	76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, VSCALE2	—	24	—	µA/MHz
38.4 MHz crystal	—	25	—	µA/MHz
38 MHz HFRCO	—	19	35	µA/MHz
26 MHz HFRCO	—	21	—	µA/MHz
16 MHz HFRCO	—	27	—	µA/MHz
1 MHz HFRCO	—	215	770	µA/MHz

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Current consumption in EM2 mode, VSCALE0	IEM2_VS	Full RAM retention and RTC run- ning from LFXO	—	1.94	—	µA
Full RAM retention and RTC run- ning from LFRCO	—	1.95	4.9	µA
24 kB RAM retention and RTC running from LFXO	—	1.81	—	µA
24 kB RAM retention and RTC running from LFRCO in precision mode	—	2.34	—	µA
8 kB RAM retention and RTC run- ning from LFXO	—	1.64	—	µA
8 kB RAM retention and RTC run- ning from LFRCO	—	1.65	—	µA
8 kB RAM retention and RTC run- ning from LFXO, Radio RAM and CPU cache not retained	—	1.39	—	µA
Current consumption in EM3 mode, VSCALE0	IEM3_VS	8 kB RAM retention and RTC run- ning from ULFRCO	—	1.41	3.7	µA
Current consumption in EM4 mode	IEM4	No BURTC, no LF oscillator	—	0.17	0.43	µA
BURTC with LFXO	—	0.50	—	µA
Current consumption during reset	IRST	Hard pin reset held	—	234	—	µA
Additional current in EM2 or EM3 when any peripheral in PD0B is enabled1	IPD0B_VS		—	0.56	—	µA
Note: 1. Extra current consumed by power domain. Does not include current associated with the enabled peripherals. See for a list of the peripherals in each power domain.

MCU current consumption at 1.8 V

Unless otherwise indicated, typical conditions are: AVDD = DVDD = RFVDD = PAVDD = VREGVDD = 1.8 V. DC-DC not used. Voltage scaling level = VSCALE1. TA = 25 °C. Minimum and maximum values in this table represent the worst conditions across process variation at TA = 25 °C.

MCU current consumption at 1.8 V

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Current consumption in EM0 mode with all peripherals dis- abled	IACTIVE	76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running Prime from flash, VSCALE2	—	42	—	µA/MHz
76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running while loop from flash, VSCALE2	—	39	—	µA/MHz
76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, CPU running CoreMark loop from flash, VSCALE2	—	54	—	µA/MHz
38.4 MHz crystal, CPU running Prime from flash	—	41	—	µA/MHz
38.4 MHz crystal, CPU running while loop from flash	—	39	—	µA/MHz
38.4 MHz crystal, CPU running CoreMark loop from flash	—	55	—	µA/MHz
38 MHz HFRCO, CPU running while loop from flash	—	33	—	µA/MHz
26 MHz HFRCO, CPU running while loop from flash	—	35	—	µA/MHz
16 MHz HFRCO, CPU running while loop from flash	—	40	—	µA/MHz
1 MHz HFRCO, CPU running while loop from flash	—	227	—	µA/MHz
Current consumption in EM1 mode with all peripherals dis- abled	IEM1	76.8 MHz HFRCO w/ DPLL refer- enced to 38.4 MHz crystal, VSCALE2	—	24	—	µA/MHz
38.4 MHz crystal	—	25	—	µA/MHz
38 MHz HFRCO	—	19	—	µA/MHz
26 MHz HFRCO	—	21	—	µA/MHz
16 MHz HFRCO	—	27	—	µA/MHz
1 MHz HFRCO	—	213	—	µA/MHz

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Current consumption in EM2 mode, VSCALE0	IEM2_VS	Full RAM retention and RTC running from LFXO	—	1.87	—	µA
Full RAM retention and RTC running from LFRCO	—	1.86	—	µA
24 kB RAM retention and RTC running from LFXO	—	1.73	—	µA
24 kB RAM retention and RTC running from LFRCO in precision mode	—	2.26	—	µA
8 kB RAM retention and RTC running from LFXO	—	1.57	—	µA
8 kB RAM retention and RTC running from LFRCO	—	1.56	—	µA
8 kB RAM retention and RTC running from LFXO, Radio RAM and CPU cache not retained	—	1.32	—	µA
Current consumption in EM3 mode, VSCALE0	IEM3_VS	8 kB RAM retention and RTC running from ULFRCO	—	1.34	—	µA
Current consumption in EM4 mode	IEM4	No BURTC, no LF oscillator	—	0.13	—	µA
BURTC with LFXO	—	0.44	—	µA
Current consumption during reset	IRST	Hard pin reset held	—	190	—	µA
Additional current in EM2 or EM3 when any peripheral in PD0B is enabled1	IPD0B_VS		—	0.54	—	µA
Note: 1. Extra current consumed by power domain. Does not include current associated with the enabled peripherals. See for a list of the peripherals in each power domain.

Radio current consumption at 3.0V using DCDC

RF current consumption measured with MCU in EM1, HCLK = 38.4 MHz, and all MCU peripherals disabled. Unless otherwise indica- ted, typical conditions are: VREGVDD = 3.0V. AVDD = DVDD = IOVDD = RFVDD = PAVDD = 1.8 V powered from DCDC. TA = 25 °C. Minimum and maximum values in this table represent the worst conditions across process variation at TA = 25 °C.

Radio current consumption at 3.0V using DCDC

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
System current consumption in receive mode, active pack- et reception	IRX_ACTIVE	125 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	3.7	—	mA
125 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	4.0	—	mA
125 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.1	—	mA
500 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	3.8	—	mA
500 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	4.0	—	mA
500 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.2	—	mA
1 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	3.6	—	mA
1 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	3.8	—	mA
1 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	3.9	—	mA
2 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	4.0	—	mA
2 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	4.2	—	mA
2 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.4	—	mA

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
System current consumption in receive mode, listening for packet	IRX_LISTEN	125 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	3.8	—	mA
125 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	4.0	—	mA
125 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.1	—	mA
500 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	3.8	—	mA
500 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	4.0	—	mA
500 kbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.1	—	mA
1 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	3.6	—	mA
1 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	3.8	—	mA
1 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.0	—	mA
2 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1, EM1P (Radio clocks only)	—	4.1	—	mA
2 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE1	—	4.3	—	mA
2 Mbit/s, 2GFSK, f = 2.4 GHz, VSCALE2	—	4.5	—	mA
System current consumption in transmit mode	ITX	f = 2.4 GHz, CW, 0 dBm PA, 0 dBm output power, VSCALE1, EM1P (Radio clocks only)	—	4.1	—	mA
f = 2.4 GHz, CW, 6 dBm PA, 6 dBm output power, VSCALE1, EM1P (Radio clocks only)	—	8.2	—	mA
f = 2.4 GHz, CW, 0 dBm PA, 0 dBm output power, VSCALE1	—	4.3	—	mA
f = 2.4 GHz, CW, 6 dBm PA, 6 dBm output power, VSCALE1	—	8.4	—	mA
f = 2.4 GHz, CW, 0 dBm PA, 0 dBm output power, VSCALE2	—	4.4	—	mA
f = 2.4 GHz, CW, 6 dBm PA, 6 dBm output power, VSCALE2	—	8.5	—	mA

Flash Characteristic

Table 4.9. Flash Characteristics

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Flash Supply voltage during write or erase	VFLASH		1.71	—	3.8	V
Flash erase cycles before failure1	ECFLASH	TA ≤ 125 °C	10,000	—	—	cycles
Flash data retention1	RETFLASH	TA ≤ 125 °C	10	—	—	years
Program Time	tPROG	one word (32-bits)	42.1	44	45.6	uSec
average per word over 128 words	10.3	10.9	11.3	uSec
Page Erase Time	tPERASE		11.4	12.9	14.4	ms
Mass Erase Time	tMERASE	Erases all of User Code area	11.7	13	14.3	ms
Program Current	IPROG		—	—	1.45	mA
Page Erase Current	IPERASE	Page Erase	—	—	1.34	mA
Mass Erase Current	IMERASE	Mass Erase	—	—	1.28	mA
Note: 1. Flash data retention information is published in the Quarterly Quality and Reliability Report.

Wake Up, Entry, and Exit times

Unless otherwise specified, these times are measured using the HFRCO at 19 MHz.

Table 4.10. Wake Up, Entry, and Exit times

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
WakeupTime from EM1	tEM1_WU	Code execution from flash	—	3	—	AHB Clocks
Code execution from RAM	—	1.42	—	µs
WakeupTime from EM2	tEM2_WU	Code execution from flash, No Voltage Scaling	—	13.22	—	µs
Code execution from RAM, No Voltage Scaling	—	5.15	—	µs
Voltage scaling up one level1	—	37.89	—	µs
Voltage scaling up two levels2	—	50.56	—	µs
WakupTime from EM3	tEM3_WU	Code execution from flash, No Voltage Scaling	—	13.21	—	µs
Code execution from RAM, No Voltage Scaling	—	5.15	—	µs
Voltage scaling up one level1	—	37.90	—	µs
Voltage scaling up two levels2	—	50.55	—	µs
WakeupTime from EM4	tEM4_WU	Code execution from flash	—	8.81	—	ms
Entry time to EM1	tEM1_ENT	Code execution from flash	—	1.29	—	µs
Entry time to EM2	tEM2_ENT	Code execution from flash	—	5.23	—	µs
Entry time to EM3	tEM3_ENT	Code execution from flash	—	5.23	—	µs
Entry time to EM4	tEM4_ENT	Code execution from flash	—	9.96	—	µs
Voltage scaling in time in EM03	tSCALE	Up from VSCALE1 to VSCALE2	—	32	—	µs
Down from VSCALE2 to VSCALE1	—	172	—	µs
Note: Voltage scaling one level is between VSCALE0 and VSCALE1 or between VSCALE1 and VSCALE2. Voltage scaling two levels is between VSCALE0 and VSCALE2. During voltage scaling in EM0, RAM is inaccessible and processor will be halted until complete.

RFSENSE Low-energy Wake-on-RF

Table 4.11. RFSENSE Low-energy Wake-on-RF

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Average current	IRFSENSE	RF energy below wake threshold	—	138	—	nA
Selective mode, RF energy above threshold but no OOK sync detec- ted	—	131	—	nA
RF level above which RFSENSE will detect signal1	THRESTRIG	Threshold set to -34 dBm	-28	—	—	dBm
Threshold set to -22 dBm	-19	—	—	dBm
RF level below which RFSENSE will not detect sig- nal1	THRESNOTRIG	Threshold set to -34 dBm	—	—	-40	dBm
Threshold set to -22 dBm	—	—	-26	dBm
Sensitivity in selective OOK mode1	SENSOOK	Sensitivity for > 90% probability of OOK detection2, threshold set to -34 dBm	-28	—	—	dBm
Sensitivity for > 90% probability of OOK detection2, threshold set to -22 dBm	-19	—	—	dBm
Note: Values collected with conducted measurements performed at the end of the matching network. Selective wake signal is 1 kHz OOK Manchester-coded, 8 bits of preamble, 32-bit sync word.

2.4 GHz RF Transceiver Characteristics

RF Transmitter Characteristics

RF Transmitter General Characteristics for the 2.4 GHz Band Unless otherwise indicated, typical conditions are: TA = 25 °C, VREGVDD = 3.0V, AVDD = DVDD = IOVDD = RFVDD = PAVDD = 1.8 V powered from DCDC. Crystal frequency=38.4 MHz. RF center frequency 2.45 GHz.

Table 4.12. RF Transmitter General Characteristics for the 2.4 GHz Band

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
RF tuning frequency range	FRANGE		2400	—	2483.5	MHz
Radio-only current consump- tion while transmitting1	ITX_RADIO	f = 2.4 GHz, CW, 0 dBm PA, 0 dBm output power	—	3.4	—	mA
f = 2.4 GHz, CW, 6 dBm PA, 6 dBm output power	—	7.5	—	mA
Maximum TX power2	POUTMAX	6 dBm PA3	—	6	—	dBm
0 dBm PA	—	0	—	dBm
Minimum active TX power	POUTMIN	6 dBm PA	—	-27	—	dBm
0 dBm PA	—	-28	—	dBm
Output power variation vs supply voltage variation, fre- quency = 2450 MHz	POUTVAR_V	6 dBm PA output power, using DCDC with VREGVDD swept from 1.8 to 3.0 V	—	0.04	—	dB
0 dBm PA output power, using DCDC with VREGVDD swept from 1.8 to 3.0 V	—	0.03	—	dB
Output power variation vs temperature, Frequency = 2450 MHz	POUTVAR_T	6 dBm PA at 6 dBm, (-40 to +125 °C)	—	0.18	—	dB
0 dBm PA at 0 dBm, (-40 to +125 °C)	—	1.4	—	dB
6 dBm PA at 6 dBm, (-40 to +85 °C)	—	0.17	—	dB
0 dBm PA at 0 dBm, (-40 to +85 °C)	—	1.0	—	dB
Output power variation vs RF frequency	POUTVAR_F	6 dBm PA, 6 dBm	—	0.20	—	dB
0 dBm PA, 0 dBm	—	0.19	—	dB
Spurious emissions of har- monics in restricted bands per FCC Part 15.205/15.209	SPURHRM_FCC_ R	Continuous transmission of CW carrier, Pout = POUTMAX, Test Frequency = 2450 MHz.	—	-47	—	dBm

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Spurious emissions out-of- band (above 2.483 GHz or below 2.4 GHz) in restricted bands, per FCC part 15.205/15.209	SPUROOB_FCC_ R	Restricted bands 30-88 MHz, Continuous transmission of CW carrier, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-47	—	dBm
Restricted bands 88 – 216 MHz, Continuous transmission of CW carrier, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-47	—	dBm
Restricted bands 216 – 960 MHz, Continuous transmission of CW carrier, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-47	—	dBm
Restricted bands > 960 MHz, Continuous transmission of CW carrier, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-47	—	dBm
Spurious emissions out-of- band in non-restricted bands per FCC Part 15.247	SPUROOB_FCC_ NR	Frequencies above 2.483 GHz or below 2.4 GHz, continuous trans- mission CW carrier, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-26	—	dBc
Spurious emissions per ETSI EN300.440	SPURETSI440	47-74 MHz,87.5-108 MHz, 174-230 MHz, 470-862 MHz, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-60	—	dBm
25-1000 MHz, excluding above frequencies. Pout = POUTMAX, Test Frequency = 2450 MHz	—	-42	—	dBm
1G-14G, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-36	—	dBm
Spurious emissions out-of- band, per ETSI 300.328	SPURETSI328	[2400-2BW to 2400-BW], [2483.5+BW to 2483.5+2BW], Pout = POUTMAX, Test Frequency = 2450 MHz	—	-26	—	dBm
47-74 MHz, 87.5-118 MHz, 174-230 MHz, 470-862 MHz, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-60	—	dBm
30-47 MHz, 74-87.5 MHz, 118-174 MHz, 230-470 MHz, 862-1000 MHz , Pout = POUTMAX, Test Frequency = 2450 MHz	—	-42	—	dBm
1G-12.75 GHz, excluding bands listed above, Pout = POUTMAX, Test Frequency = 2450 MHz	—	-36	—	dBm
[2400-BW to 2400], [2483.5 to 2483.5+BW] Pout = POUTMAX, Test Frequency = 2450 MHz	—	-16	—	dBm

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Note:

Supply current to radio, supplied by DC-DC with 3.0 V, measured at VREGVDD.
Supported transmit power levels are determined by the ordering part number (OPN). Transmit power ratings for all devices cov- ered in this data sheet can be found in the Max TX Power column of the Ordering Information Table.
The PA is capable of delivering higher than 6 dBm output power (see Figure 4.9 Transmitter Output Power on page 71). How- ever, all transmitter characteristics and recommended application circuits are specified at 6 dBm output. If used with the recom- mended application circuits above 6 dBm, harmonics may be higher than regulatory limits.

RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 1 Mbps Data Rate

Unless otherwise indicated, typical conditions are: TA = 25 °C, VREGVDD = 3.0V, AVDD = DVDD = IOVDD = RFVDD = PAVDD = 1.8 V powered from DCDC. Crystal frequency=38.4 MHz. RF center frequency 2.45 GHz.

Table 4.13. RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 1 Mbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Transmit 6 dB bandwidth	TXBW	Pout = 6 dBm	—	630	—	kHz
Pout = 0 dBm	—	640	—	kHz
Power spectral density limit	PSDLIMIT	Pout = 6 dBm, Per FCC part 15.247 at 6 dBm	—	2.9	—	dBm/ 3kHz
Pout = 0 dBm, Per FCC part 15.247 at 0 dBm	—	-3.2	—	dBm/ 3kHz
Per ETSI 300.328 at 10 dBm/1 MHz	—	7.1	—	dBm
Occupied channel bandwidth per ETSI EN300.328	OCPETSI328	Pout = 6 dBm 99% BW at highest and lowest channels in band	—	1.1	—	MHz
Pout = 0 dBm 99% BW at highest and lowest channels in band	—	1.1	—	MHz
In-band spurious emissions, with allowed exceptions1	SPURINB	Pout = 6 dbm, Inband spurs at ± 2 MHz	—	-41	—	dBm
Pout = 0 dbm, Inband spurs at ± 2 MHz	—	-48	—	dBm
Pout = 6 dBm Inband spurs at ± 3 MHz	—	-47	—	dBm
Pout = 0dbm Inband spurs at ± 3 MHz	—	-54	—	dBm
Note: 1. Per Bluetooth Core_5.1, Vol.6 Part A, Section 3.2.2, exceptions are allowed in up to three bands of 1 MHz width, centered on a frequency which is an integer multiple of 1 MHz. These exceptions shall have an absolute value of -20 dBm or less.

RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 2 Mbps Data Rate

Table 4.14. RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 2 Mbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Transmit 6 dB bandwidth	TXBW	Pout = 6 dBm	—	1250	—	kHz
Pout = 0 dBm	—	1220	—	kHz
Power spectral density limit	PSDLIMIT	Pout = 6 dBm, Per FCC part 15.247 at 6 dBm	—	0.5	—	dBm/ 3kHz
Pout = 0 dBm, Per FCC part 15.247 at 0 dBm	—	-5.7	—	dBm/ 3kHz
Per ETSI 300.328 at 10 dBm/1 MHz	—	6.3	—	dBm
Occupied channel bandwidth per ETSI EN300.328	OCPETSI328	Pout = 6 dBm 99% BW at highest and lowest channels in band	—	2.1	—	MHz
Pout = 0 dBm 99% BW at highest and lowest channels in band	—	2.1	—	MHz
In-band spurious emissions, with allowed exceptions1	SPURINB	Pout = 6 dbm, Inband spurs at ± 4 MHz	—	-41	—	dBm
Pout = 0 dBm, Inband spurs at ± 4 MHz	—	-47	—	dBm
Pout = 6 dBm Inband spurs at ± 6 MHz	—	-46	—	dBm
Pout = 0 dbm Inband spurs at ± 6 MHz	—	-53	—	dBm
Note: 1. Per Bluetooth Core_5.1, Vol.6 Part A, Section 3.2.2, exceptions are allowed in up to three bands of 1 MHz width, centered on a frequency which is an integer multiple of 1 MHz. These exceptions shall have an absolute value of -20 dBm or less.

RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 500 kbps Data Rate

Table 4.15. RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 500 kbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Transmit 6 dB bandwidth	TXBW	Pout = 6 dBm	—	640	—	kHz
Pout = 0 dBm	—	650	—	kHz
Power spectral density limit	PSDLIMIT	Pout = 6 dBm, Per FCC part 15.247 at 6 dBm	—	2.8	—	dBm/ 3kHz
Pout = 0 dBm, Per FCC part 15.247 at 0 dBm	—	-3.5	—	dBm/ 3kHz
Per ETSI 300.328 at 10 dBm/1 MHz	—	7.1	—	dBm
Occupied channel bandwidth per ETSI EN300.328	OCPETSI328	Pout = 6 dBm 99% BW at highest and lowest channels in band	—	1.1	—	MHz
Pout = 0 dBm 99% BW at highest and lowest channels in band	—	1.1	—	MHz
In-band spurious emissions, with allowed exceptions1	SPURINB	Pout = 6 dbm, Inband spurs at ± 2 MHz	—	-41	—	dBm
Pout = 0 dbm, Inband spurs at ± 2 MHz	—	-48	—	dBm
Pout = 6 dBm Inband spurs at ± 3 MHz	—	-47	—	dBm
Pout = 0dbm Inband spurs at ± 3 MHz	—	-54	—	dBm
Note: 1. Per Bluetooth Core_5.1, Vol.6 Part A, Section 3.2.2, exceptions are allowed in up to three bands of 1 MHz width, centered on a frequency which is an integer multiple of 1 MHz. These exceptions shall have an absolute value of -20 dBm or less.

RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 125 kbps Data Rate

Table 4.16. RF Transmitter Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 125 kbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Transmit 6 dB bandwidth	TXBW	Pout = 6 dBm	—	600	—	kHz
Pout = 0 dBm	—	600	—	kHz
Power spectral density limit	PSDLIMIT	Pout = 6 dBm, Per FCC part 15.247 at 6 dBm	—	2.0	—	dBm/ 3kHz
Pout = 0 dBm, Per FCC part 15.247 at 0 dBm	—	-4.2	—	dBm/ 3kHz
Per ETSI 300.328 at 10 dBm/1 MHz	—	7.1	—	dBm
Occupied channel bandwidth per ETSI EN300.328	OCPETSI328	Pout = 6 dBm 99% BW at highest and lowest channels in band	—	1.1	—	MHz
Pout = 0 dBm 99% BW at highest and lowest channels in band	—	1.1	—	MHz
In-band spurious emissions, with allowed exceptions1	SPURINB	Pout = 6 dbm, Inband spurs at ± 2 MHz	—	-41	—	dBm
Pout = 0 dbm, Inband spurs at ± 2 MHz	—	-47	—	dBm
Pout = 6 dBm Inband spurs at ± 3 MHz	—	-47	—	dBm
Pout = 0dbm Inband spurs at ± 3 MHz	—	-54	—	dBm
Note: 1. Per Bluetooth Core_5.1, Vol.6 Part A, Section 3.2.2, exceptions are allowed in up to three bands of 1 MHz width, centered on a frequency which is an integer multiple of 1 MHz. These exceptions shall have an absolute value of -20 dBm or less.

RF Transmitter Characteristics for 802.15.4 DSSS-OQPSK in the 2.4 GHz Band

Table 4.17. RF Transmitter Characteristics for 802.15.4 DSSS-OQPSK in the 2.4 GHz Band

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Error vector magnitude per 802.15.4-2011	EVM	Average across frequency, signal is DSSS-OQPSK reference pack- et, Pout = 6 dBm	—	3.0	—	% rms
Average across frequency, signal is DSSS-OQPSK reference pack- et, Pout = 0 dBm	—	3.0	—	% rms
Power spectral density limit	PSDLIMIT	Relative, at carrier ± 3.5 MHz, Pout = 6 dBm	—	-50.7	—	dBc/ 100kHz
Relative, at carrier ± 3.5 MHz, Pout = 0 dBm	—	-50.8	—	dBc/ 100kHz
Absolute, at carrier ± 3.5 MHz, Pout = 6 dBm	—	-52.5	—	dBm/ 100kHz
Absolute, at carrier ± 3.5 MHz, Pout = 0 dBm	—	-58.3	—	dBm/ 100kHz
Per FCC part 15.247, Pout = 6 dBm	—	-1.4	—	dBm/ 3kHz
Per FCC part 15.247, Pout = 0 dBm	—	-7.4	—	dBm/ 3kHz
ETSI 300.328 Pout = 6 dBm	—	5.6	—	dBm
ETSI 300.328 Pout = 0 dbm	—	-1.0	—	dBm
Occupied channel bandwidth per ETSI EN300.328	OCPETSI328	99% BW at highest and lowest channels in band, Pout = 6 dBm	—	2.2	—	MHz
99% BW at highest and lowest channels in band, Pout = 0 dBm	—	2.2	—	MHz

RF Receiver Characteristics

RF Receiver General Characteristics for the 2.4 GHz Band

Table 4.18. RF Receiver General Characteristics for the 2.4 GHz Band

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
RF tuning frequency range	FRANGE		2400	—	2483.5	MHz
Radio-only current consump- tion in receive mode1	IRX_RADIO		—	2.5	—	mA
Receive mode maximum spurious emission	SPURRX	30 MHz to 1 GHz	—	-63	—	dBm
1 GHz to 12 GHz	—	-53	—	dBm
Max spurious emissions dur- ing active receive mode, per FCC Part 15.109(a)	SPURRX_FCC	216 MHz to 960 MHz, conducted measurement	—	-47	—	dBm
Above 960 MHz, conducted measurement.	—	-47	—	dBm
2GFSK Sensitivity	SENS2GFSK	2 Mbps 2GFSK signal, 1% PER	—	-93	—	dBm
250 kbps 2GFSK signal, 0.1% BER	—	-104	—	dBm
Note: 1. Supply current to radio, supplied by DC-DC with 3.0 V, measured at VREGVDD.

RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 1 Mbps Data Rate

Table 4.19. RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 1 Mbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Max usable receiver input level	SAT	Signal is reference signal1	—	10	—	dBm
Sensitivity	SENS	Signal is reference signal, 37 byte payload2	—	-98.9	—	dBm
Signal is reference signal, 255 byte payload1	—	-97.4	—	dBm
With non-ideal signals3 1	—	-96.9	—	dBm
Signal to co-channel interfer- er	C/ICC	(see notes)1 4	—	8.7	—	dB
N ± 1 Adjacent channel se- lectivity	C/I1	Interferer is reference signal at +1 MHz offset1 5 4 6	—	-6.6	—	dB
Interferer is reference signal at -1 MHz offset1 5 4 6	—	-6.5	—	dB
N ± 2 Alternate channel se- lectivity	C/I2	Interferer is reference signal at +2 MHz offset1 5 4 6	—	-40.9	—	dB
Interferer is reference signal at -2 MHz offset1 5 4 6	—	-39.9	—	dB
N ± 3 Alternate channel se- lectivity	C/I3	Interferer is reference signal at +3 MHz offset1 5 4 6	—	-45.9	—	dB
Interferer is reference signal at -3 MHz offset1 5 4 6	—	-46.2	—	dB
Selectivity to image frequen- cy	C/IIM	Interferer is reference signal at im- age frequency with 1 MHz preci- sion1 6	—	-23.5	—	dB
Selectivity to image frequen- cy ± 1 MHz	C/IIM_1	Interferer is reference signal at im- age frequency +1 MHz with 1 MHz precision1 6	—	-40.9	—	dB
Interferer is reference signal at im- age frequency -1 MHz with 1 MHz precision1 6	—	-6.6	—	dB
Intermodulation performance	IM	n = 3 (see note7)	—	-17.1	—	dBm
Note: 0.017% Bit Error Rate. 0.1% Bit Error Rate. With non-ideal signals as specified in Bluetooth Test Specification RF-PHY.TS.5.0.1 section 4.7.1 Desired signal -67 dBm. Desired frequency 2402 MHz ≤ Fc ≤ 2480 MHz. With allowed exceptions. As specified in Bluetooth Core specification version 5.1, Vol 6, Part A, Section 4.4

RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 2 Mbps Data Rate

Table 4.20. RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 2 Mbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Max usable receiver input level	SAT	Signal is reference signal1	—	10	—	dBm
Sensitivity	SENS	Signal is reference signal, 37 byte payload2	—	-96.2	—	dBm
Signal is reference signal, 255 byte payload1	—	-94.6	—	dBm
With non-ideal signals3 1	—	-94.4	—	dBm
Signal to co-channel interfer- er	C/ICC	(see notes)1 4	—	8.8	—	dB
N ± 1 Adjacent channel se- lectivity	C/I1	Interferer is reference signal at +2 MHz offset1 5 4 6	—	-9.2	—	dB
Interferer is reference signal at -2 MHz offset1 5 4 6	—	-6.6	—	dB
N ± 2 Alternate channel se- lectivity	C/I2	Interferer is reference signal at +4 MHz offset1 5 4 6	—	-43.3	—	dB
Interferer is reference signal at -4 MHz offset1 5 4 6	—	-44.0	—	dB
N ± 3 Alternate channel se- lectivity	C/I3	Interferer is reference signal at +6 MHz offset1 5 4 6	—	-48.6	—	dB
Interferer is reference signal at -6 MHz offset1 5 4 6	—	-50.7	—	dB
Selectivity to image frequen- cy	C/IIM	Interferer is reference signal at im- age frequency with 1 MHz preci- sion1 6	—	-23.8	—	dB
Selectivity to image frequen- cy ± 2 MHz	C/IIM_1	Interferer is reference signal at im- age frequency +2 MHz with 1 MHz precision1 6	—	-43.3	—	dB
Interferer is reference signal at im- age frequency -2 MHz with 1 MHz precision1 6	—	-9.2	—	dB
Intermodulation performance	IM	n = 3 (see note7)	—	-18.8	—	dBm
Note: 0.017% Bit Error Rate. 0.1% Bit Error Rate. With non-ideal signals as specified in Bluetooth Test Specification RF-PHY.TS.5.0.1 section 4.7.1 Desired signal -64 dBm. Desired frequency 2402 MHz ≤ Fc ≤ 2480 MHz. With allowed exceptions. As specified in Bluetooth Core specification version 5.1, Vol 6, Part A, Section 4.4

RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 500 kbps Data Rate

Table 4.21. RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 500 kbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Max usable receiver input level	SAT	Signal is reference signal1	—	10	—	dBm
Sensitivity	SENS	Signal is reference signal, 37 byte payload2	—	-102.5	—	dBm
Signal is reference signal, 255 byte payload1	—	-101.2	—	dBm
With non-ideal signals3 1	—	-100.2	—	dBm
Signal to co-channel interfer- er	C/ICC	(see notes)1 4	—	2.7	—	dB
N ± 1 Adjacent channel se- lectivity	C/I1	Interferer is reference signal at +1 MHz offset1 5 4 6	—	-8.0	—	dB
Interferer is reference signal at -1 MHz offset1 5 4 6	—	-7.9	—	dB
N ± 2 Alternate channel se- lectivity	C/I2	Interferer is reference signal at +2 MHz offset1 5 4 6	—	-46.5	—	dB
Interferer is reference signal at -2 MHz offset1 5 4 6	—	-49.9	—	dB
N ± 3 Alternate channel se- lectivity	C/I3	Interferer is reference signal at +3 MHz offset1 5 4 6	—	-48.9	—	dB
Interferer is reference signal at -3 MHz offset1 5 4 6	—	-53.8	—	dB
Selectivity to image frequen- cy	C/IIM	Interferer is reference signal at im- age frequency with 1 MHz preci- sion1 6	—	-48.3	—	dB
Selectivity to image frequen- cy ± 1 MHz	C/IIM_1	Interferer is reference signal at im- age frequency +1 MHz with 1 MHz precision1 6	—	-49.9	—	dB
Interferer is reference signal at im- age frequency -1 MHz with 1 MHz precision1 6	—	-46.5	—	dB
Note: 0.017% Bit Error Rate. 0.1% Bit Error Rate. With non-ideal signals as specified in Bluetooth Test Specification RF-PHY.TS.5.0.1 section 4.7.1 Desired signal -72 dBm. Desired frequency 2402 MHz ≤ Fc ≤ 2480 MHz. With allowed exceptions.

RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 125 kbps Data Rate

Table 4.22. RF Receiver Characteristics for Bluetooth Low Energy in the 2.4 GHz Band 125 kbps Data Rate

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Max usable receiver input level	SAT	Signal is reference signal1	—	10	—	dBm
Sensitivity	SENS	Signal is reference signal, 37 byte payload2	—	-106.7	—	dBm
Signal is reference signal, 255 byte payload1	—	-106.4	—	dBm
With non-ideal signals3 1	—	-105.8	—	dBm
Signal to co-channel interfer- er	C/ICC	(see notes)1 4	—	0.9	—	dB
N ± 1 Adjacent channel se- lectivity	C/I1	Interferer is reference signal at +1 MHz offset1 5 4 6	—	-13.6	—	dB
Interferer is reference signal at -1 MHz offset1 5 4 6	—	-13.4	—	dB
N ± 2 Alternate channel selectivity	C/I2	Interferer is reference signal at +2 MHz offset1 5 4 6	—	-52.6	—	dB
Interferer is reference signal at -2 MHz offset1 5 4 6	—	-55.8	—	dB
N ± 3 Alternate channel selectivity	C/I3	Interferer is reference signal at +3 MHz offset1 5 4 6	—	-53.7	—	dB
Interferer is reference signal at -3 MHz offset1 5 4 6	—	-59.0	—	dB
Selectivity to image frequency	C/IIM	Interferer is reference signal at im- age frequency with 1 MHz preci- sion1 6	—	-52.7	—	dB
Selectivity to image frequen- cy ± 1 MHz	C/IIM_1	Interferer is reference signal at im- age frequency +1 MHz with 1 MHz precision1 6	—	-53.7	—	dB
Interferer is reference signal at im- age frequency -1 MHz with 1 MHz precision1 6	—	-52.6	—	dB
Note: 0.017% Bit Error Rate. 0.1% Bit Error Rate. With non-ideal signals as specified in Bluetooth Test Specification RF-PHY.TS.5.0.1 section 4.7.1 Desired signal -79 dBm. Desired frequency 2402 MHz ≤ Fc ≤ 2480 MHz. With allowed exceptions.

RF Receiver Characteristics for 802.15.4 DSSS-OQPSK in the 2.4 GHz Band

Table 4.23. RF Receiver Characteristics for 802.15.4 DSSS-OQPSK in the 2.4 GHz Band

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Max usable receiver input level, 1% PER	SAT	Signal is reference signal1. Packet length is 20 octets	—	10	—	dBm
Sensitivity, 1% PER	SENS	Signal is reference signal. Packet length is 20 octets	—	-102.3	—	dBm
Co-channel interferer rejec- tion, 1% PER	CCR	Desired signal 3 dB above sensi- tivity limit	—	-1.7	—	dB
High-side adjacent channel rejection, 1% PER. Desired is reference signal at 3 dB above reference sensitivity level2	ACRP1	Interferer is reference signal at +1 channel-spacing	—	34.9	—	dB
Low-side adjacent channel rejection, 1% PER. Desired is reference signal at 3 dB above reference sensitivity level2	ACRM1	Interferer is reference signal at -1 channel-spacing	—	34.8	—	dB
Alternate channel rejection, 1% PER. Desired is refer- ence signal at 3 dB above reference sensitivity level2	ACR2	Interferer is reference signal at ± 2 channel-spacing	—	47.1	—	dB
Image rejection , 1% PER. Desired is reference signal at 3 dB above reference sensi- tivity level2	IR	Interferer is CW in image band3	—	34.1	—	dB
Blocking rejection of all other channels, 1% PER. Desired is reference signal at 3 dB above reference sensitivity level2. Interferer is reference signal	BLOCK	Interferer frequency < Desired fre- quency – 3 channel-spacing	—	53.2	—	dB
Interferer frequency > Desired fre- quency + 3 channel-spacing	—	53.1	—	dB
RSSI resolution	RSSIRES	-100 dBm to +5 dBm	—	0.25	—	dB
RSSI accuracy in the linear region as defined by 802.15.4-2003	RSSILIN		—	+/-6	—	dB
Note: Reference signal is defined as O-QPSK DSSS per 802.15.4, Frequency range = 2400-2483.5 MHz, Symbol rate = 62.5 ksym- bols/s. Reference sensitivity level is -85 dBm. Due to low-IF frequency, there is some overlap of adjacent channel and image channel bands. Adjacent channel CW blocker tests place the Interferer center frequency at the Desired frequency ± 5 MHz on the channel raster, whereas the image rejection test places the CW interferer near the image frequency of the Desired signal carrier, regardless of the channel raster.

Oscillators

High Frequency Crystal Oscillator

Unless otherwise indicated, typical conditions are: AVDD = DVDD = 3.0 V. TA = 25 °C. Minimum and maximum values in this table represent the worst conditions across process variation, operating supply voltage range, and operating temperature range.

Table 4.24. High Frequency Crystal Oscillator

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Crystal Frequency	FHFXO	see note1	—	38.4	—	MHz
Supported crystal equivalent series resistance (ESR)	ESRHFXO_38M4	38.4 MHz, CL = 10 pF2 3	—	40	60	Ω
Supported range of crystal load capacitance4	CHFXO_LC	38.4 MHz, ESR = 40 Ohm3	—	10	—	pF
Supply Current	IHFXO		—	415	—	µA
Startup Time	TSTARTUP	38.4 MHz, ESR = 40 Ohm, CL = 10 pF	—	160	—	µs
On-chip tuning cap step size5	SSHFXO		—	0.04	—	pF
Note: The BLE radio requires a 38.4 MHz crystal with a tolerance of ± 50 ppm over temperature and aging. Please use the recommen- ded crystal. The crystal should have a maximum ESR less than or equal to this maximum rating. RF performance characteristics have been determined using crystals with an ESR of 40 Ω and CL of 10 pF. Total load capacitance as seen by the crystal. The tuning step size is the effective step size when incrementing one of the tuning capacitors by one count. The step size for the each of the indivdual tuning capacitors is twice this value.

Low Frequency Crystal Oscillator

Table 4.25. Low Frequency Crystal Oscillator

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Crystal Frequency	FLFXO		—	32.768	—	kHz
Supported Crystal equivalent series resistance (ESR)	ESRLFXO	GAIN = 0	—	—	80	kΩ
GAIN = 1 to 3	—	—	100	kΩ
Supported range of crystal load capacitance 1	CLFXO_CL	GAIN = 0	4	—	6	pF
GAIN = 1	6	—	10	pF
GAIN = 2	10	—	12.5	pF
GAIN = 3 (see note2)	12.5	—	18	pF
Current consumption	ICL12p5	ESR = 70 kOhm, CL = 12.5 pF, GAIN3 = 2, AGC4 = 1	—	357	—	nA
Startup Time	TSTARTUP	ESR = 70 kOhm, CL = 7 pF, GAIN3 = 1, AGC4 = 1	—	63	—	ms
On-chip tuning cap step size	SSLFXO		—	0.26	—	pF
On-chip tuning capacitor val- ue at minimum setting5	CLFXO_MIN	CAPTUNE = 0	—	4	—	pF
On-chip tuning capacitor val- ue at maximum setting5	CLFXO_MAX	CAPTUNE = 0x4F	—	24.5	—	pF
Note: Total load capacitance seen by the crystal Crystals with a load capacitance of greater than 12 pF require external load capacitors. In LFXO_CAL Register In LFXO_CFG Register The effective load capacitance seen by the crystal will be CLFXO/2. This is because each XTAL pin has a tuning cap and the two caps will be seen in series by the crystal

High Frequency RC Oscillator (HFRCO)

Table 4.26. High Frequency RC Oscillator (HFRCO)

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Frequency Accuracy	FHFRCO_ACC	For all production calibrated fre- quencies	-3	—	3	%
Current consumption on all supplies 1	IHFRCO	FHFRCO = 1 MHz	—	28	—	µA
FHFRCO = 2 MHz	—	28	—	µA
FHFRCO = 4 MHz	—	28	—	µA
FHFRCO = 5 MHz	—	30	—	µA
FHFRCO = 7 MHz	—	60	—	µA
FHFRCO = 10 MHz	—	66	—	µA
FHFRCO = 13 MHz	—	79	—	µA
FHFRCO = 16 MHz	—	88	—	µA
FHFRCO = 19 MHz	—	92	—	µA
FHFRCO = 20 MHz	—	105	—	µA
FHFRCO = 26 MHz	—	118	—	µA
FHFRCO = 32 MHz	—	141	—	µA
FHFRCO = 38 MHz	—	172	—	µA
FHFRCO = 80 MHz	—	289	—	µA
Clock out current for HFRCODPLL2	ICLKOUT_HFRCOD PLL	FORECEEN bit of CTRL = 1 and the CLKOUTDIS0 bit of TEST = 1.	—	2.72	—	µA/MHz
FORECEEN bit of CTRL i= 1 and the CLKOUTDIS1 bit of TEST = 1.	—	0.36	—	µA/MHz
Startup Time3	TSTARTUP	FREQRANGE = 0 to 7	—	1.2	—	µs
FREQRANGE = 8 to 15	—	0.6	—	µs

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Band Frequency Limits4	fHFRCO_BAND	FREQRANGE = 0	3.71	—	5.24	MHz
FREQRANGE = 1	4.39	—	6.26	MHz
FREQRANGE = 2	5.25	—	7.55	MHz
FREQRANGE = 3	6.22	—	9.01	MHz
FREQRANGE = 4	7.88	—	11.6	MHz
FREQRANGE = 5	9.9	—	14.6	MHz
FREQRANGE = 6	11.5	—	17.0	MHz
FREQRANGE = 7	14.1	—	20.9	MHz
FREQRANGE = 8	16.4	—	24.7	MHz
FREQRANGE = 9	19.8	—	30.4	MHz
FREQRANGE = 10	22.7	—	34.9	MHz
FREQRANGE = 11	28.6	—	44.4	MHz
FREQRANGE = 12	33.0	—	51.0	MHz
FREQRANGE = 13	42.2	—	64.6	MHz
FREQRANGE = 14	48.8	—	74.8	MHz
FREQRANGE = 15	57.6	—	87.4	MHz
Note: Does not include additional clock tree current. See specifications for additional current when selected as a clock source for a par- ticular clock multiplexer. When the HFRCO is enabled for characterization using the FORCEEN bit, the total current will be the HFRCO core current plus the specified CLKOUT current. When the HFRCO is enabled on demand, the clock current may be different. Hardware delay ensures settling to within ± 0.5%. Hardware also enforces this delay on a band change. The frequency band limits represent the lowest and highest freqeuncy which each band can achieve over the operating range.

Fast Start_Up RC Oscillator (FSRCO)

Table 4.27. Fast Start_Up RC Oscillator (FSRCO)

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
FSRCO frequency	FFSRCO		17.2	20	21.2	MHz

Precision Low Frequency RC Oscillator (LFRCO)

Table 4.28. Precision Low Frequency RC Oscillator (LFRCO)

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Nominal oscillation frequen- cy	FLFRCO		—	32.768	—	kHz
Frequency accuracy	FLFRCO_ACC	Normal mode	-3	—	3	%
Precision mode1, across operat- ing temperature range2	-500	—	500	ppm
Startup time	tSTARTUP	Normal mode	—	204	—	µs
Precision mode1	—	11.7	—	ms
Current consumption	ILFRCO	Normal mode	—	175	—	nA
Precision mode1, T = stable at 25 °C 3	—	655	—	nA
Note: The LFRCO operates in high-precision mode when CFG_HIGHPRECEN is set to 1. High-precision mode is not available in EM4. Includes ± 40 ppm frequency tolerance of the HFXO crystal. Includes periodic re-calibration against HFXO crystal oscillator.

Ultra Low Frequency RC Oscillator

Table 4.29. Ultra Low Frequency RC Oscillator

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Oscillation Frequency	FULFRCO		0.944	1.0	1.095	kHz

GPIO Pins (3V GPIO pins)

Table 4.30. GPIO Pins (3V GPIO pins)

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Leakage current	ILEAK_IO	MODEx = DISABLED, IOVDD = 1.71 V	—	1.9	—	nA
MODEx = DISABLED, IOVDD = 3.0 V	—	2.5	—	nA
MODEx = DISABLED, IOVDD = 3.8 V TA = 85 °C	—	—	150	nA
Pins other than PA00, PA03, PB00, PC03, PC04 and PD00; MODEx = DISABLED, IOVDD = 3.8 V TA = 125 °C	—	—	200	nA
Pins PA00, PA03, PB00, PC03, PC04 and PD00; MODEx = DISA- BLED, IOVDD = 3.8 V TA = 125 °C	—	—	550	nA
Input low voltage1	VIL	Any GPIO pin	—	—	0.3*IOVDD	V
RESETn	—	—	0.3*DVDD	V
Input high voltage1	VIH	Any GPIO pin	0.7*IOVDD	—	—	V
RESETn	0.7*DVDD	—	—	V
Hysteresis of input voltage	VHYS	Any GPIO pin	0.05*IOVD D	—	—	V
RESETn	0.05*DVDD	—	—	V
Output high voltage	VOH	Sourcing 20mA, IOVDD = 3.0 V	0.8 * IOVDD	—	—	V
Sourcing 8mA, IOVDD = 1.71 V	0.6 * IOVDD	—	—	V
Output low voltage	VOL	Sinking 20mA, IOVDD = 3.0 V	—	—	0.2 * IOVDD	V
Sinking 8mA, IOVDD = 1.71 V	—	—	0.4 * IOVDD	V
GPIO rise time	TGPIO_RISE	IOVDD = 3.0 V, Cload = 50pF, SLEWRATE = 4, 10% to 90%	—	8.4	—	ns
IOVDD = 1.71 V, Cload = 50pF, SLEWRATE = 4, 10% to 90%	—	13	—	ns
GPIO fall time	TGPIO_FALL	IOVDD = 3.0 V, Cload = 50pF, SLEWRATE = 4, 90% to 10%	—	7.1	—	ns
IOVDD = 1.71 V, Cload = 50pF, SLEWRATE = 4, 90% to 10%	—	11.9	—	ns

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Pull up/down resistance2	RPULL	Any GPIO pin. Pull-up to IOVDD: MODEn = DISABLE DOUT=1. Pull-down to VSS: MODEn = WIREDORPULLDOWN DOUT = 0.	35	44	55	kΩ
RESETn pin. Pull-up to DVDD	35	44	55	kΩ
Maximum filtered glitch width	TGF	MODE = INPUT, DOUT = 1	—	27	—	ns
Note: GPIO input thresholds are proportional to the IOVDD pin. RESETn input thresholds are proportional to DVDD. GPIO pull-ups connect to IOVDD supply, pull-downs connect to VSS. RESETn pull-up connects to DVDD.

Analog to Digital Converter (IADC)

Specified at 1 Msps, ADCCLK = 10 MHz, OSR=2, unless otherwise indicated.

Table 4.31. Analog to Digital Converter (IADC)

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Main analog supply	VAVDD	Normal Mode	1.71	—	3.8	V
Maximum Input Range1	VIN_MAX	Maximum allowable input voltage	0	—	AVDD	V
Full-Scale Voltage	VFS	Voltage required for Full-Scale measurement	—	VREF / Gain	—
Input Measurement Range	VIN	Differential Mode – Plus and Mi- nus inputs	-VFS	—	+VFS	V
Single Ended Mode – One input tied to ground	0	—	VFS	V
Input Sampling Capacitance	Cs	Analog Gain = 1x	—	1.8	—	pF
Analog Gain = 2x	—	3.6	—	pF
Analog Gain = 4x	—	7.2	—	pF
Analog Gain = 0.5x	—	0.9	—	pF
ADC clock frequency	fCLK	Normal Mode	—	—	10	MHz
Throughput rate	fSAMPLE	fCLK = 10 MHz, OSR = 2	—	—	1	Msps
fCLK = 10 MHz, OSR = 32	—	—	76.9	ksps
Current from all supplies, Continuous operation	IADC_CONT	Normal Mode, 1 Msps, OSR = 2, fCLK = 10 MHz	—	290	385	µA
Current in Standby mode. ADC is not functional but can wake up in 1us.	ISTBY	Normal Mode	—	16	—	µA
ADC Startup Time	tstartup	From power down state	—	5	—	µs
From Standby state	—	1	—	µs
ADC Resolution2	Resolution		—	12	—	bits
Differential Nonlinearity	DNL	Differential Input, OSR = 2, (No missing codes) .	-1	+/- 0.25	1.5	LSB12
Integral Nonlinearity	INL	Normal Mode, Differential Input, OSR = 2.	-2.5	+/- 0.65	2.5	LSB12
Effective number of bits3	ENOB	Differential Input. Gain = 1x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V. OSR=2	10.5	11.7	—	bits
Differential Input. Gain = 1x, OSR = 32, fIN = 2.5 kHz, Internal VREF = 1.21 V.	—	13.5	—	bits
Differential Input. Gain = 1x, OSR = 32, fIN = 2.5 kHz, External VREF = 1.25 V.	—	14.3	—	bits

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Signal to Noise + Distortion Ratio3	SNDR	Differential Input. Gain=1x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V	65	72.3	—	dB
Differential Input. Gain=2x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V	—	72.3	—	dB
Differential Input. Gain=4x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V	—	68.8	—	dB
Differential Input. Gain=0.5x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V	—	72.5	—	dB
Total Harmonic Distortion	THD	Differential Input. Gain=1x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V	—	-80.8	-70	dB
Spurious-Free Dynamic Range	SFDR	Differential Input. Gain=1x, OSR = 2, fIN = 10 kHz, Internal VREF=1.21V	72	86.5	—	dB
Common Mode Rejection Ratio	CMRR	Normal Mode. DC to 100 Hz	—	87.0	—	dB
Normal Mode. AC high frequency	—	68.6	—	dB
Power Supply Rejection Ra- tio	PSRR	Normal mode. DC to 100 Hz	—	80.4	—	dB
Normal mode. AC high frequency, using VREF pad.	—	33.4	—	dB
Normal mode. AC high frequency, using internal VBGR.	—	65.2	—	dB
Gain Error	GE	GAIN=1 and 0.5, using external VREF, direct mode.	-0.3	0.069	0.3	%
GAIN=2, using external VREF, di- rect mode.	-0.4	0.151	0.4	%
GAIN=3, using external VREF, di- rect mode.	-0.7	0.186	0.7	%
GAIN=4, using external VREF, di- rect mode.	-1.1	0.227	1.1	%
Internal VREF4, all GAIN settings	-1.5	0.023	1.5	%
Offset	OFFSET	GAIN=1 and 0.5, Differential Input	-3	0.27	3	LSB
GAIN=2, Differential Input	-4	0.27	4	LSB
GAIN=3, Differential Input	-4	0.25	4	LSB
GAIN=4, Differential Input	-4	0.29	4	LSB
External reference voltage range1	VEVREF		1.0	—	AVDD	V
Internal Reference voltage	VIVREF		—	1.21	—	V

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Note:

When inputs are routed to external GPIO pins, the maximum pin voltage is limited to the lower of the IOVDD and AVDD supplies.
ADC output resolution depends on the OSR and digital averaging settings. With no digital averaging, ADC output resolution is 12 bits at OSR=2, 13 bits at OSR = 4, 14 bits at OSR = 8, 15 bits at OSR = 16, 16 bits at OSR = 32 and 17 bits at OSR = 64. Digital averaging has a similar impact on ADC output resolution. See the product reference manual for additional details.
The relationship between ENOB and SNDR is specified according to the equation: ENOB = (SNDR – 1.76) / 6.02.
Includes error from internal VREF drift.

Temperature Sense

Table 4.32. Temperature Sense

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
Temperature sensor range1	TRANGE		-40	—	125	°C
Temperature sensor resolu- tion	TRESOLUTION		—	0.25	—	°C
Measurement noise (RMS)	TNOISE	Single measurement	—	0.6	—	°C
16-sample average (TEMPAVG- NUM = 0)	—	0.17	—	°C
64-sample average (TEMPAVG- NUM = 1)	—	0.12	—	°C
Temperature offset	TOFF	Mean error of uncorrected output across full temperature range	—	3.14	—	°C
Temperature sensor accura- cy2 3	TACC	Direct output accuracy after mean error (TOFF) removed	-3	—	3	°C
After linearization in software, no calibration	-2	—	2	°C
After linearization in software, with single-temperature calibration at 25 °C4	-1.5	—	1.5	°C
Measurement interval	tMEAS		—	250	—	ms
Note: The sensor reports absolute die temperature in °K. All specifications are in °C to match the units of the specified product temper- aure range. Error is measured as the deviation of the mean temperature reading from the expected die temperature. Accuracy numbers rep- resent statistical minimum and maximum using ± 4 standard deviations of measured error. The raw output of the temperature sensor is a predictable curve. It can be linearized with a polynomial function for additional ac- curacy. Assuming calibration accuracy of ± 0.25 °C.

Brown Out Detectors

DVDD BOD

BOD Thresholds on DVDD in EM0 and EM1 only, unless otherwise noted. Typical conditions are at TA = 25 °C. Minimum and maxi- mum values in this table represent the worst conditions across process variation, operating supply voltage range, and operating temperature range.

Table 4.33. DVDD BOD

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
BOD threshold	VDVDD_BOD	Supply Rising	—	1.64	1.71	V
Supply Falling	1.62	1.65	—	V
BOD response time	tDVDD_BOD_DE- LAY	Supply dropping at 100mV/µs slew rate1	—	0.95	—	µs
BOD hysteresis	VDVDD_BOD_HYS T		—	20	—	mV
Note: 1. If the supply slew rate exceeds the specified slew rate, the BOD may trip later than expected (at a threshold below the minimum specified threshold), or the BOD may not trip at all (e.g., if the supply ramps down and then back up at a very fast rate)

LE DVDD BOD

BOD thresholds on DVDD pin for low energy modes EM2 to EM4, unless otherwise noted.

Table 4.34. LE DVDD BOD

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
BOD threshold	VDVDD_LE_BOD	Supply Falling	1.5	—	1.71	V
BOD response time	tDVDD_LE_BOD_D ELAY	Supply dropping at 2mV/µs slew rate1	—	50	—	µs
BOD hysteresis	VDVDD_LE_BOD_ HYST		—	20	—	mV
Note: 1. If the supply slew rate exceeds the specified slew rate, the BOD may trip later than expected (at a threshold below the minimum specified threshold), or the BOD may not trip at all (e.g., if the supply ramps down and then back up at a very fast rate)

AVDD and IOVDD BODs

BOD thresholds for AVDD BOD and IOVDD BOD. Available in all energy modes.

Table 4.35. AVDD and IOVDD BODs

Parameter	Symbol	Test Condition	Min	Typ	Max	Unit
BOD threshold	VBOD	Supply falling	1.45	—	1.71	V
BOD response time	tBOD_DELAY	Supply dropping at 2mV/µs slew rate1	—	50	—	µs
BOD hysteresis	VBOD_HYST		—	20	—	mV
Note: 1. If the supply slew rate exceeds the specified slew rate, the BOD may trip later than expected (at a threshold below the minimum specified threshold), or the BOD may not trip at all (e.g., if the supply ramps down and then back up at a very fast rate)

Revision History

Revision June, 2020

3.7.2 Cryptographic Accelerator: Removed text referencing DPA.
3.7.4 Secure Debug with Lock/Unlock: Removed text referencing Secure Element.
4.1 Electrical Characteristics:
Expanded Power Supply Pin Dependencies section to include more details and restrictions on DECOUPLE
Finalized remaining MIN / MAX specifications according to characterization and qualification results.
Table 4.30 GPIO Pins (3V GPIO pins) on page 54: Relaxed 3.8 V, 125 °C GPIO maximum leakage specification on PA00, PA03, PB00, PC03, PC04, and PD00 from 400 nA to 550 nA.
Corrected BLE Bit Error Rate conditions for sensitivity measurements with 255 byte payload.
Added GPIO hysteresis specification.
Updated DCDC lifetime condition guidance in 4.4.1 DC-DC Operating Limits.
Expanded IADC descriptions to include information at higher oversampling ratios and added typical performance curve.
Corrected tolerance of dimension “L” in Table 8.1 TQFN32 Package Dimensions on page 91.

Revision February, 2020

1. Feature List: Updated list slightly to highlight different features.
Expanded 3.7 Security Features section and corrected security details.
Added 3.9.2 Voltage Scaling section.
4.1 Electrical Characteristics:
Additional characterization results and test limits added where available.
Removed thermistor driver specification table until full software support becomes available.
Updated 5.2 RF Matching Networks section with recommended match values.
Updated 9.3 QFN40 Package Marking with mark details.

Revision December, 2019

4.1 Electrical Characteristics:
Added detailed lifetime information to DC-DC specifications section.
Additional characterization results and preliminary test limits added where available.
Added DC-DC efficiency plots and updated supply current plots to 4.20 Typical Performance Curves.

Revision October, 2019

In the front page block diagram, updated the lowest energy mode for LETIMER.
Updated 3.5.2 Low Energy Timer (LETIMER) lowest energy mode.
1. Feature List updated with additional modulation formats, protocol stack, and security details.
2. Ordering Information:
OPN numbering changes for security grade differentiator.
Supported protocol stack details updated.
4.1 Electrical Characteristics:
Additional characterization results and preliminary test limits added where available.
Corrected maximum clock speed details in General Operating Conditions Table.
Removed specification lines with 3 dBm output power conditions from RF transmit tables.
Removed DECOUPLE BOD table.
Added timing diagrams and specifications for PDM and USART SPI.
Added 4.20 Typical Performance Curves.

Revision July, 2019

2. Ordering Information: Updated part number to revision C, added several new variants.
4.1 Electrical Characteristics: Added early silicon characterization data to several tables, and refined specification conditions.
4.1 Electrical Characteristics: Added flash electrical characteristics table.
Minor wording edits for System Overview sections.

Silicon Labs intends to provide customers with the latest, accurate, and in-depth documentation of all peripherals and modules available for system and software implementers using or intending to use the Silicon Labs products. Characterization data, available modules and peripherals, memory sizes and memory addresses refer to each specific device, and “Typical” parameters provided can and do vary in different applications. Application examples described herein are for illustrative purposes only. Silicon Labs reserves the right to make changes without further notice to the product information, specifications, and descriptions herein, and does not give warranties as to the accuracy or completeness of the included information. Without prior notification, Silicon Labs may update product firmware during the manufacturing process for security or reliability reasons. Such changes will not alter the specifications or the performance of the product. Silicon Labs shall have no liability for the consequences of use of the information supplied in this document. This document does not imply or expressly grant any license to design or fabricate any integrated circuits. The products are not designed or authorized to be used within any FDA Class III devices, applications for which FDA premarket approval is required, or Life Support Systems without the specific written consent of Silicon Labs. A “Life Support System” is any product or system intended to support or sustain life and/or health, which, if it fails, can be reasonably expected to result in significant personal injury or death. Silicon Labs products are not designed or authorized for military applications. Silicon Labs products shall under no circumstances be used in weapons of mass destruction including (but not limited to) nuclear, biological or chemical weapons, or missiles capable of delivering such weapons. Silicon Labs disclaims all express and implied warranties and shall not be responsible or liable for any injuries or damages related to use of a Silicon Labs product in such unauthorized applications.

Trademark Information

Silicon Laboratories Inc.®, Silicon Laboratories®, Silicon Labs®, SiLabs® and the Silicon Labs logo®, Bluegiga®, Bluegiga Logo®, ClockBuilder®, CMEMS®, DSPLL®, EFM®, EFM32®, EFR, Ember®, Energy Micro, Energy Micro logo and combinations thereof, “the world’s most energy friendly microcontrollers”, Ember®, EZLink®, EZRadio®, EZRadioPRO®, Gecko®, Gecko OS, Gecko OS Studio, ISOmodem®, Precision32®, ProSLIC®, Simplicity Studio®, SiPHY®, Telegesis, the Telegesis Logo®, USBXpress® , Zentri, the Zentri logo and Zentri DMS, Z- Wave®, and others are trademarks or registered trademarks of Silicon Labs. ARM, CORTEX, Cortex-M3 and THUMB are trademarks or registered trademarks of ARM Holdings. Keil is a registered trademark of ARM Limited. Wi-Fi is a registered trademark of the Wi-Fi Alliance. All other products or brand names mentioned herein are trademarks of their respective holders.

SILICON Libs EFR32BG22 Wireless Gecko SoC Family Data Sheet – SILICON Libs EFR32BG22 Wireless Gecko SoC Family Data Sheet –

[xyz-ips snippet=”download-snippet”]

Posted

2023-01-13

Gecko

admin

Tags:

EFR32BG22, SILICON, Wireless Gecko SoC

SILICON Libs EFR32BG22 Wireless Gecko SoC Family Data Sheet

<img decoding="async" width="321" height="159" src="https://manualscenter.org/wp-content/uploads/2023/01/silicon-labs-2.png" data-ezsrc="https://manualscenter.org/wp-content/uploads/2023/01/silicon-labs-2.png">

EFR32BG22 Wireless Gecko SoC Family Data Sheet

Wireless Gecko applications include

Wide selection of MCU peripherals

Ordering Information

Introduction

Clocking

Counters/Timers and PWM

Analog

Peripheral Power Subdomains

Core and Memory

Electrical Specifications

Electrical Characteristics

Low Frequency Crystal Oscillator

Ultra Low Frequency RC Oscillator

Brown Out Detectors

Revision History

Trademark Information