Tag: Zeiss OptiRecon option

ZEISS OptiRecon Improve 3D X-ray image quality and increase scan speed by 2Xfor semiconductor packages The new ZEISS OptiRecon option for ZEISS Xradia Versa X-ray microscopes (XRM) and Xradia Context microCT enables significantly faster 3D X-ray image acquisition at any energy setting through an image reconstruction algorithm known as iterative reconstruction.In addition to speeding up…